For MATS-2010M Magnetic material analyzer,Hysteresis Graph measurement
system, automatic measurement of the dynamic magnetic hysteresis loop of
oriented and non-oriented silicon steel under the condition of 50 Hz, 60 Hz, 400
Hz and 1 kHz, accurate measurement of the static magnetic characteristic
parameters such as amplitude permeability μa, loss angle δ, specific total loss
Ps, remanence Br and coercivity Hc. With special testing fixture, it can
directly measure the iron core and stator core of the transformer.
Windows measurement software applied simply. The product conforms to
China National Standards GB/T 3655-2000, GB/T 13789-92 and international
standard IEC 404-2, IEC 60404-3, IEC 60404-6.
The controlling of
computer and A/D sampling replace the traditional analog bridge, frequency
meter, ammeter, voltage meter, power meter, the whole testing process is
automatic completed.
·Testing
sample varieties: hot rolling, cold rolling silicon steel materials, permalloy,
amorphous and nm crystal.
·Testing
sample shapes: ribbon and chip open samples, toroid, E and U closing
samples.
·Open
circuit samples adopt Epstein Square to form closed magnetic
circuit, it can also select permeameter. Closing sample can be put under direct
winding measurement, finished transformer can be also put under direct
measurement.
·Sample
(iron core), magnetizing coil (N1) and measuring coil (N2) form a no-load
transformer.
·Non-inductive
resistance connect to the magnetizing coil loop, and measure the pressure drop
of non-inductive resistance to determine the magnetizing current and get the
field intensity. The field peak value can be locked through the data feedback,
the precision is 0.5%.
·To
obtain the field induction intensity through the numeral integral in the voltage
of measuring coil. The field peak value can be locked through the data feedback,
the precision is 0.5%.
·Power
source and sampling amplifier put into a chassis which make the interface very
simple: a RS232 interface connect to the computer, the second voltage signal
connect to high speed A/D card.
·Adopt
volammetry and digital integration to measure dynamic hysteresis loop, it can
accurately measure dynamic magnetic characteristic parameters such as μa, δ, Ps,
Br and Hc, etc.
·Automatic
and continuous measurement up to 255 testing points, the testing time of every
testing point is about 30 seconds, fixed-frequency, fixed Bm or fixed Hm
optional in multipoint test.
·Powerful
function of the software, the technical request to the testing staff is very
low.
System Specifications
Under 50 Hz frequency, use 25 cm Epstein Square to measure silicon steel
sample, technical indices as follows:
| Parameters
measured |
Bm (%) |
Hm (%) |
μa (%) |
Ps (%) |
δ (%) |
| Uncertainty (k = 2) |
1 |
1 |
2 |
1 |
2 |
| Repeatability (constant
temperature) |
± 0.5 |
± 0.5 |
± 1 |
± 0.5 |
± 1 |
Instrument Specifications
| MATS - 2010M Dynamic Hysteresisgraph |
|
PC6112
A/D Card |
Output Power:
500 VA sine wave
Frequency Range: 45 Hz ~ 1000
Hz
Frequency Fineness: 1
Hz
Frequency Error: < 0.05%
Output Voltage: 0 ~ 10 V ~ 50 V ~ 150 V ~ 300 V, four automatic
ranges
Voltage Fineness: Program Control 1 mV, panel
< 0.1% * current range
Voltage Distortion
Factor: Superior to 0.5%
Voltage Stability:
Superior to 0.02%
Sampling Current: 2 mA, 5 mA,
10 mA, 20 mA, 40 mA, 80 mA, 200 mA,
400
mA, 800 mA, 1.6 A, 4 A, 8 A (Peak
Value)
Sample Voltage: 20 mV, 40 mV, 100 mV,
200 mV, 400 mV, 800 mV, 2 V,
4 V, 8 V, 16
V, 40 V, 80 V, 160 V, 320 V, 800 V, 1600 V (Peak Value) |
Conversion
time: <= 2.5 μs (every channel)
Resolution and
Linearity: 16 Bits ± 1 LSB
Voltage Range: ± 5 V ~ ±
10 V
Sampling Clock: 6 μs ~ 10 ms Hardware
Clock
Internal Storage Capacity: 4 k
Bytes
Bus Structure: PCI
busbar |
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